for the FTIR Microscopy & Imaging Systems - Spotlight Contact
about the FTIR Microscopy & Imaging Systems - Spotlight
Spotlight™ Systems are a complete family of high performance FT-IR microscopy and FT-IR/NIR chemical imaging systems.
- Very high sensitivity
- Rapid-scan IR imaging
The new Spotlight 150i and Spotlight 200i can be configured with either a PerkinElmer Frontier™ FT-IR optical bench, or a Spectrum Two™ optical bench. Both system configurations are powered by the acclaimed DynaScan™ Interferometer, which provides performance without the compromise of competitive designs.
Frontier Spotlight Microscopy and Imaging System options include both transmission and reflection micro-sampling, and its Micro ATR Imaging option provides information down to areas as small as 3µm. A number of sample automation and detector options are available to suit many applications. Each system is engineered to the highest quality specifications, providing high energy throughput, reproducibility and, ultimately, confidence in the quality of your result.
Spotlight imaging systems reveal the identity of a vast array of chemical components within materials, as well as displaying areas of homogeneity and variation. A preferred materials testing technique due to its speed, ease-of-use and reliability, FT-IR/NIR imaging provides higher level understanding to facilitate your research. System Platforms that meet your largest and your smallest challenges.
- Fast, efficient data collection
- Automated mathematical data analysis routines
- Image analysis software
- Extensive applications flexibility